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Description

45° Multi Holder for 6 Pin StubsDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

5 Front Angle: 25 ± 5 Back Angle: 15 ± 5 Side Angle: 22

Calibration Specimen for Scanning Tunneling Microscope

4 N/m DESCRIPTION

1 and 1/2µm pitch patterns allow calibrations up to 200

Ideal for cleaning contaminants from glassware

Packaging for the Cu and Ni grids is 100/vial and for Au grids 25/vial

Complete System: pump

The two bases move 0-25mm

There is a storage map provided with the box

With the known size of the pore of the Quantifoil®

1mm wide x 3mm deep slots to clamp thin specimens or cross sections

Springloaded Vise Clamp (287KB PDF)