Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

FESPA-V22. 8N m, 75kHz, 4 Sided Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingMode imaging and force modulation in air. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular,FESP FESPA AFM probes. Brukers new line of FESP high quality premiumetched silicon probes set the industry standard for soft

Elimination of cantilever tuning

5+/-2 Tip Radius (Nom): 10 Tip Coating: None Tilt Compensation: 12

- 10 probes per pack

Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries

• Tighter dimensional specifications for improved probe to probe consistency

~ 1e-13EMU

with SCANASYST-AIR-HPI-SS probes

Cantilever Material: Diamond cone probe

The EBD-CDR probes for 3D reference and hybrid metrology: witha full range of EBD-CDR probes from 130 nm down to 15 nm

MultiMode 8

2 nm respectively

5 Tip Radius (Nom): 8 Tip Set Back (Nom): 11